"Can Test Generation and Program Repair Inform Automated Assessment of ..."

Ruizhen Gu, José Miguel Rojas, Donghwan Shin (2025)

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DOI: 10.1109/ICST62969.2025.10988955

access: closed

type: Conference or Workshop Paper

metadata version: 2025-07-11

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Ruizhen Gu, José Miguel Rojas, Donghwan Shin:
Can Test Generation and Program Repair Inform Automated Assessment of Programming Projects? ICST 2025: 699-710

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