


default search action
"Assessing Software Product Line Testing Via Model-Based Mutation: An ..."
Christopher Henard et al. (2013)
- Christopher Henard, Mike Papadakis

, Gilles Perrouin
, Jacques Klein
, Yves Le Traon:
Assessing Software Product Line Testing Via Model-Based Mutation: An Application to Similarity Testing. ICST Workshops 2013: 188-197

manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.


Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCID













