"Test Instrumentation and Pattern Matching for Automatic Failure ..."

Dan Travison, Geoff Staneff (2008)

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DOI: 10.1109/ICST.2008.69

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Dan Travison, Geoff Staneff:
Test Instrumentation and Pattern Matching for Automatic Failure Identification. ICST 2008: 377-386

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