"Location M estimator with optimal edge detector for quality inspection of ..."

Jayesh D. Chauhan, Chintan K. Modi, Kunal J. Pithadiya (2010)

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DOI: 10.1145/1741906.1742043

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-25

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Jayesh D. Chauhan, Chintan K. Modi, Kunal J. Pithadiya:
Location M estimator with optimal edge detector for quality inspection of surface mount device capacitor. ICWET 2010: 595-600

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