"Examination of LV grid phenomena by means of PHIL testing."

Georg Lauss et al. (2012)

> Home

Details and statistics

DOI: 10.1109/IECON.2012.6389586

access: closed

type: Conference or Workshop Paper

metadata version: 2020-03-27

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/iecon/LaussLBSB12
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/iecon/LaussLBSB12
Georg Lauss, Felix Lehfuss, Benoit Bletterie, Thomas I. Strasser, Roland Bründlinger:
Examination of LV grid phenomena by means of PHIL testing. IECON 2012: 4771-4776

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.