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"Analysis of Current for Fault- Tolerant Control of Excitation Fault in DSEG."

Tengxiang Wen et al. (2018)

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DOI: 10.1109/IECON.2018.8591860

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-27

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  dblp key:
  - conf/iecon/WenZZZ18
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  - https://dblp.org/rec/conf/iecon/WenZZZ18
Tengxiang Wen, Bo Zhou, Xingwei Zhou, Yiqi Zhu:
Analysis of Current for Fault- Tolerant Control of Excitation Fault in DSEG. IECON 2018: 403-408

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