"Stress-Testing USB Accelerators for Efficient Edge Inference."

Alexander Van Der Staay, Raphael Fischer, Sebastian Buschjäger (2024)

> Home

Details and statistics

DOI: 10.1109/SEC62691.2024.00015

access: closed

type: Conference or Workshop Paper

metadata version: 2025-01-21

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/ieeesec/Staay0B24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/ieeesec/Staay0B24
Alexander Van Der Staay, Raphael Fischer, Sebastian Buschjäger:
Stress-Testing USB Accelerators for Efficient Edge Inference. SEC 2024: 1-14

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.