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"Gate Oxide Induced Reliability Assessment of Junctionless FinFET-Based ..."

Navneet Gandhi et al. (2023)

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DOI: 10.1109/SENSORS56945.2023.10324885

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

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  dblp key:
  - conf/ieeesensors/GandhiJRKDKGB23
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  - https://dblp.org/rec/conf/ieeesensors/GandhiJRKDKGB23
Navneet Gandhi, Rajeewa Kumar Jaisawal, Sunil Rathore, P. N. Kondekar, Ankit Dixit, Navneen Kumar, Vihar Georgiev, Navjeet Bagga:
Gate Oxide Induced Reliability Assessment of Junctionless FinFET-Based Hydrogen Gas Sensor. SENSORS 2023: 1-4

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