"3rd IEEE Symposium on Visual Analytics Science and Technology, IEEE VAST ..."

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type: Editorship

metadata version: 2020-08-11

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3rd IEEE Symposium on Visual Analytics Science and Technology, IEEE VAST 2008, Columbus, OH, USA, October 19-24, 2008. IEEE Computer Society 2008, ISBN 978-1-4244-2935-6 [contents]

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