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"Test and Design-for-Test of Mixed-Signal Integrated Circuits."

Marcelo Lubaszewski, José Luis Huertas (2004)

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DOI: 10.1007/1-4020-8159-6_7

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-19

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  dblp key:
  - conf/ifip/LubaszewskiH04
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  - https://dblp.org/rec/conf/ifip/LubaszewskiH04
Marcelo Lubaszewski, José Luis Huertas:
Test and Design-for-Test of Mixed-Signal Integrated Circuits. IFIP Congress Tutorials 2004: 183-212

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