"Early Fault Detection in Industry Using Models at Various Abstraction Levels."

Jozef Hooman, Arjan J. Mooij, Hans van Wezep (2012)

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DOI: 10.1007/978-3-642-30729-4_19

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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Jozef Hooman, Arjan J. Mooij, Hans van Wezep:
Early Fault Detection in Industry Using Models at Various Abstraction Levels. IFM 2012: 268-282

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