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"Analysis of OMPS in-flight CCD dark current degradation."
Chunhui Pan et al. (2016)
- Chunhui Pan, Fuzhong Weng, Trevor Beck, Ding Liang, Eve-Marie Devaliere, Wanchun Chen, Shuoguo Ding:
Analysis of OMPS in-flight CCD dark current degradation. IGARSS 2016: 1966-1969
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