"Image Inspection System for Defect Detection of Multilayer Ceramic Capacitors."

Chun-Chieh Tseng, Mao-Fu Lai, Por-Song Lee (2006)

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DOI: 10.1109/IIH-MSP.2006.265088

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Chun-Chieh Tseng, Mao-Fu Lai, Por-Song Lee:
Image Inspection System for Defect Detection of Multilayer Ceramic Capacitors. IIH-MSP 2006: 659-662

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