"Enhancing 3D XPT/SOM Reliability: Strategies for Mitigating Spike Current ..."

C. L. Sung et al. (2025)

> Home

Details and statistics

DOI: 10.1109/IMW61990.2025.11026942

access: closed

type: Conference or Workshop Paper

metadata version: 2025-06-25

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/imw2/SungDCJCGBYBCZL25
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/imw2/SungDCJCGBYBCZL25
C. L. Sung, D. Daudelin, Wei-Chih Chien, R. C. Jordan, S. Cheng, Lynne M. Gignac, Douglas M. Bishop, C. W. Yeh, L. Buzi, C. W. Cheng, J. X. Zheng, E. K. Lai, A. Ray, Alexander Grun, H. Y. Cheng, C. H. Lin, T. W. Chang, T. Takken, Robert L. Bruce, M. Bright Sky, H. L. Lung:
Enhancing 3D XPT/SOM Reliability: Strategies for Mitigating Spike Current and Improving Read Endurance. IMW 2025: 1-4

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.