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"Data-driven fault diagnosis and prognosis for process faults using ..."

Ruosen Qi, Jie Zhang (2020)

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DOI: 10.1109/INDIN45582.2020.9442177

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-25

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Ruosen Qi, Jie Zhang:
Data-driven fault diagnosis and prognosis for process faults using principal component analysis and extreme learning machine. INDIN 2020: 775-780

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