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"Distributed power semiconductor stress test & measurement architecture."

Benjamin Steinwender et al. (2013)

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DOI: 10.1109/INDIN.2013.6622870

access: closed

type: Conference or Workshop Paper

metadata version: 2019-12-27

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Benjamin Steinwender, Sascha Einspieler, Michael Glavanovics, Wilfried Elmenreich:
Distributed power semiconductor stress test & measurement architecture. INDIN 2013: 129-134

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