"In-Circuit Mitigation Approach of Single Event Transients for 45nm Flip-Flops."

Sarah Azimi, Corrado De Sio, Luca Sterpone (2020)

Details and statistics

DOI: 10.1109/IOLTS50870.2020.9159738

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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