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"A Configurable Modular Test Processor and Scan Controller Architecture."

R. Frost et al. (2007)

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DOI: 10.1109/IOLTS.2007.6

access: closed

type: Conference or Workshop Paper

metadata version: 2023-08-24

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  dblp key:
  - conf/iolts/BrandenburgRGKV07
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  persistent URL:
  - https://dblp.org/rec/conf/iolts/BrandenburgRGKV07
R. Frost, D. Rudolph, Christian Galke, René Kothe, Heinrich Theodor Vierhaus:
A Configurable Modular Test Processor and Scan Controller Architecture. IOLTS 2007: 277-284

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