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"Automating wafer-level test of uncooled infrared detectors using wafer-prober."

Mohamed Makhlouf et al. (2017)

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DOI: 10.1109/IOLTS.2017.8046170

access: closed

type: Conference or Workshop Paper

metadata version: 2020-09-05

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  dblp key:
  - conf/iolts/MakhloufGGKVUWV17
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  persistent URL:
  - https://dblp.org/rec/conf/iolts/MakhloufGGKVUWV17
Mohamed Makhlouf, Diana Goller, Lutz Gendrisch, Stephan Kolnsberg, Franz Vogt, Alexander Utz, Dirk Weiler, Holger Vogt:
Automating wafer-level test of uncooled infrared detectors using wafer-prober. IOLTS 2017: 13-16

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