"Comparative Analysis of TID Effects in a 65 nm FD-SOI Process Under ..."

Hikaru Nakamoto et al. (2025)

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DOI: 10.1109/IOLTS65288.2025.11117120

access: closed

type: Conference or Workshop Paper

metadata version: 2025-10-14

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Hikaru Nakamoto, Taiki Ozawa, Ryuichi Nakajima, Haruto Sugisaki, Keita Yoshida, Jun Furuta, Kazutoshi Kobayashi:
Comparative Analysis of TID Effects in a 65 nm FD-SOI Process Under Gamma-Ray and Alpha-Ray Irradiation. IOLTS 2025: 1-5

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