BibTeX record conf/iolts/NofalEHGLCLWCBW17

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@inproceedings{DBLP:conf/iolts/NofalEHGLCLWCBW17,
  author    = {Issam Nofal and
               Adrian Evans and
               A.{-}L. He and
               Gang Guo and
               Yuanqing Li and
               Li Chen and
               Rui Liu and
               Haibin Wang and
               Mo Chen and
               Sang H. Baeg and
               Shi{-}Jie Wen and
               Richard Wong},
  title     = {{BPPT} - Bulk potential protection technique for hardened sequentials},
  booktitle = {23rd {IEEE} International Symposium on On-Line Testing and Robust
               System Design, {IOLTS} 2017, Thessaloniki, Greece, July 3-5, 2017},
  pages     = {28--32},
  publisher = {{IEEE}},
  year      = {2017},
  url       = {https://doi.org/10.1109/IOLTS.2017.8046194},
  doi       = {10.1109/IOLTS.2017.8046194},
  timestamp = {Wed, 20 Nov 2019 09:02:54 +0100},
  biburl    = {https://dblp.org/rec/conf/iolts/NofalEHGLCLWCBW17.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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