"Using independent component analysis for electrical impedance tomography."

Peimin Yan, Yulong Mo (2004)

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DOI: 10.1117/12.525632

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

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Peimin Yan, Yulong Mo:
Using independent component analysis for electrical impedance tomography. Image Processing: Algorithms and Systems 2004: 447-454

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