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"Meta-heuristics for Circuit Partitioning in Parallel Test Generation."

Consolación Gil et al. (1998)

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DOI: 10.1007/3-540-64359-1_702

access: closed

type: Conference or Workshop Paper

metadata version: 2021-11-09

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Consolación Gil, Julio Ortega, Antonio F. Díaz, Maria Dolores Gil Montoya:
Meta-heuristics for Circuit Partitioning in Parallel Test Generation. IPPS/SPDP Workshops 1998: 315-323

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