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"A New Approach to Validate GaN FET Reliability to Power-Line Surges Under ..."

Sandeep R. Bahl, Paul Brohlin (2019)

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DOI: 10.1109/IRPS.2019.8720479

access: closed

type: Conference or Workshop Paper

metadata version: 2019-05-31

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  dblp key:
  - conf/irps/BahlB19
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  - https://dblp.org/rec/conf/irps/BahlB19
Sandeep R. Bahl, Paul Brohlin:
A New Approach to Validate GaN FET Reliability to Power-Line Surges Under Use-Conditions. IRPS 2019: 1-4

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