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"Four point probe ramped voltage stress as an efficient method to ..."

Simon Van Beek et al. (2015)

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DOI: 10.1109/IRPS.2015.7112818

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-01

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  dblp key:
  - conf/irps/BeekMRDSMKMG15
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  - https://dblp.org/rec/conf/irps/BeekMRDSMKMG15
Simon Van Beek, Koen Martens, Philippe Roussel, Gabriele Luca Donadio, Johan Swerts, Sofie Mertens, Gouri Sankar Kar, Tai Min, Guido Groeseneken:
Four point probe ramped voltage stress as an efficient method to understand breakdown of STT-MRAM MgO tunnel junctions. IRPS 2015: 4

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