"Array-Based Statistical Characterization of CMOS Degradation Modes and ..."

Erik Bury et al. (2019)

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DOI: 10.1109/IRPS.2019.8720592

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-24

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Erik Bury, Adrian Vaisman Chasin, Michiel Vandemaele, Simon Van Beek, Jacopo Franco, Ben Kaczer, Dimitri Linten:
Array-Based Statistical Characterization of CMOS Degradation Modes and Modeling of the Time-Dependent Variability Induced by Different Stress Patterns in the {V_G, V_D} bias space. IRPS 2019: 1-6

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