"Laboratory X-Ray-Assisted Device Alteration for Fault Isolation and ..."

K. C. Celio et al. (2024)

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DOI: 10.1109/IRPS48228.2024.10529312

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-29

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K. C. Celio, S. Sen, E. Nisenboim, P. M. Pardy, B. Nguyen, V. Le, W. Nolting, S. Kumar, C. A. Peterson, A. Raveh, K. Johnson, B. Stripe, F. Su, M. Lun, S. Lewis, R. I. Spink, W. Yun:
Laboratory X-Ray-Assisted Device Alteration for Fault Isolation and Post-Silicon Debug. IRPS 2024: 1-5

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