"Impact of nanoscale polarization relaxation on endurance reliability of ..."

Yu-Chien Chiu et al. (2015)

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DOI: 10.1109/IRPS.2015.7112817

access: closed

type: Conference or Workshop Paper

metadata version: 2025-03-25

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Yu-Chien Chiu, Chun-Yen Chang, Hsiao-Hsuan Hsu, Chun-Hu Cheng, Min-Hung Lee:
Impact of nanoscale polarization relaxation on endurance reliability of one-transistor hybrid memory using combined storage mechanisms. IRPS 2015: 3

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