BibTeX record conf/irps/ChunBHKLKPP15

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@inproceedings{DBLP:conf/irps/ChunBHKLKPP15,
  author    = {Hyunsuk Chun and
               In Hak Baick and
               Sangsu Ha and
               Eunmi Kwon and
               Seungbae Lee and
               Seil Kim and
               Sangwoo Pae and
               Jongwoo Park},
  title     = {{CPI} reliability and {EMI} benefit for {MIM} {CAP} embedded {C4}
               package},
  booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
               CA, USA, April 19-23, 2015},
  pages     = {5},
  publisher = {{IEEE}},
  year      = {2015},
  url       = {https://doi.org/10.1109/IRPS.2015.7112753},
  doi       = {10.1109/IRPS.2015.7112753},
  timestamp = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl    = {https://dblp.org/rec/conf/irps/ChunBHKLKPP15.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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