"NBTI in Si0.55Ge0.45 cladding p-FinFETs: Porting the superior reliability ..."

Jacopo Franco et al. (2015)

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DOI: 10.1109/IRPS.2015.7112694

access: closed

type: Conference or Workshop Paper

metadata version: 2019-10-19

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  - https://dblp.org/rec/conf/irps/FrancoKRBMRGHTG15
Jacopo Franco, Ben Kaczer, Philippe J. Roussel, Erik Bury, Hans Mertens, Romain Ritzenthaler, Tibor Grasser, Naoto Horiguchi, Aaron Thean, Guido Groeseneken:
NBTI in Si0.55Ge0.45 cladding p-FinFETs: Porting the superior reliability from planar to 3D architectures. IRPS 2015: 2

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