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"NBTI in Si0.55Ge0.45 cladding p-FinFETs: Porting the superior reliability ..."
Jacopo Franco et al. (2015)
- Jacopo Franco, Ben Kaczer, Philippe J. Roussel, Erik Bury, Hans Mertens, Romain Ritzenthaler, Tibor Grasser
, Naoto Horiguchi, Aaron Thean, Guido Groeseneken
:
NBTI in Si0.55Ge0.45 cladding p-FinFETs: Porting the superior reliability from planar to 3D architectures. IRPS 2015: 2
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