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"Impact of time-zero and NBTI variability on sub-20nm FinFET based SRAM at ..."

Nilesh Goel et al. (2015)

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DOI: 10.1109/IRPS.2015.7112783

access: closed

type: Conference or Workshop Paper

metadata version: 2019-12-23

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  - conf/irps/GoelDKM15
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Nilesh Goel, P. Dubey, J. Kawa, S. Mahapatra:
Impact of time-zero and NBTI variability on sub-20nm FinFET based SRAM at low voltages. IRPS 2015: 5

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