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"Non-Intrusive Methodologies for Characterization of Bias Temperature ..."

Jose Angel Ortiz Gonzalez, Olayiwola Alatise, Phil Mawby (2020)

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DOI: 10.1109/IRPS45951.2020.9129637

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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  dblp key:
  - conf/irps/GonzalezAM20
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Jose Angel Ortiz Gonzalez, Olayiwola Alatise, Phil Mawby:
Non-Intrusive Methodologies for Characterization of Bias Temperature Instability in SiC Power MOSFETs. IRPS 2020: 1-10

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