Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Permanent and Transient Effects of High-Temperature Bias Stress on Room- ..."

Daniel B. Habersat, Ronald Green, Aivars J. Lelis (2019)

> Home

Details and statistics

DOI: 10.1109/IRPS.2019.8720538

access: closed

type: Conference or Workshop Paper

metadata version: 2019-05-31

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/irps/HabersatGL19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/HabersatGL19
Daniel B. Habersat, Ronald Green, Aivars J. Lelis:
Permanent and Transient Effects of High-Temperature Bias Stress on Room- Temperature $V_{T}$ Drift Measurements in SiC Power MOSFETs. IRPS 2019: 1-4

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.