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"Integrated Test Circuit for Off-State Dynamic Drain Stress Evaluation."

Joycelyn Hai et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10117885

access: closed

type: Conference or Workshop Paper

metadata version: 2023-08-04

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  dblp key:
  - conf/irps/HaiCFGDLA23
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  persistent URL:
  - https://dblp.org/rec/conf/irps/HaiCFGDLA23
Joycelyn Hai, Florian Cacho, X. Federspiel, Tidjani Garba-Seybou, A. Divay, Estelle Lauga-Larroze, Jean-Daniel Arnould:
Integrated Test Circuit for Off-State Dynamic Drain Stress Evaluation. IRPS 2023: 1-6

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