"Effect of Back Gate on Word Line Disturb Immunity of a Vertical Channel ..."

Moonyoung Jeong et al. (2024)

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DOI: 10.1109/IRPS48228.2024.10529491

access: closed

type: Conference or Workshop Paper

metadata version: 2025-11-15

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Moonyoung Jeong, Sangho Lee, Yootak Jun, Kiseok Lee, Seokhan Park, Jeonghoon Oh, Ilgweon Kim, Jemin Park:
Effect of Back Gate on Word Line Disturb Immunity of a Vertical Channel DRAM Cell Array Transistor. IRPS 2024: 23

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