"A Study on the Origin of Dynamic Charge Loss of Next Generation DRAM Cell ..."

Moonyoung Jeong et al. (2025)

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DOI: 10.1109/IRPS48204.2025.10982816

access: closed

type: Conference or Workshop Paper

metadata version: 2025-06-04

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Moonyoung Jeong, Hyungjun Noh, Sangho Lee, Yootak Jun, Jeonghoon Oh, Jemin Park, Jaihyuk Song:
A Study on the Origin of Dynamic Charge Loss of Next Generation DRAM Cell Array Transistor. IRPS 2025: 1-4

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