"High Temperature and High Humidity Reliability Evaluation of Large-Area ..."

In-Hwan Ji et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10118095

access: closed

type: Conference or Workshop Paper

metadata version: 2025-08-05

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In-Hwan Ji, Anoop Mathew, Jae-Hyung Park, Neal Oldham, Matthew McCain, Shadi Sabri, Edward Van Brunt, Brett Hull, Daniel J. Lichtenwalner, Donald A. Gajewski, John W. Palmour:
High Temperature and High Humidity Reliability Evaluation of Large-Area 1200V and 1700V SiC Diodes. IRPS 2023: 1-4

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