"Comprehensive understanding of hot carrier degradation in multiple-fin SOI ..."

Hai Jiang et al. (2015)

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DOI: 10.1109/IRPS.2015.7112837

access: closed

type: Conference or Workshop Paper

metadata version: 2021-02-14

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  - conf/irps/JiangYLXZHDLZ15
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  - https://dblp.org/rec/conf/irps/JiangYLXZHDLZ15
Hai Jiang, Longxiang Yin, Yun Li, Nuo Xu, Kai Zhao, Yandong He, Gang Du, Xiaoyan Liu, Xing Zhang:
Comprehensive understanding of hot carrier degradation in multiple-fin SOI FinFETs. IRPS 2015: 6

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