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"Origins and implications of increased channel hot carrier variability in ..."

Ben Kaczer et al. (2015)

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DOI: 10.1109/IRPS.2015.7112706

access: closed

type: Conference or Workshop Paper

metadata version: 2024-02-05

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  - conf/irps/KaczerFCGRTBWPT15
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  - https://dblp.org/rec/conf/irps/KaczerFCGRTBWPT15
Ben Kaczer, Jacopo Franco, M. Cho, Tibor Grasser, Philippe J. Roussel, Stanislav Tyaginov, M. Bina, Yannick Wimmer, Luis-Miguel Procel, Lionel Trojman, Felice Crupi, Gregory Pitner, Vamsi Putcha, Pieter Weckx, Erik Bury, Z. Ji, An De Keersgieter, Thomas Chiarella, Naoto Horiguchi, Guido Groeseneken, Aaron Thean:
Origins and implications of increased channel hot carrier variability in nFinFETs. IRPS 2015: 3

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