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"Defect-Assisted Safe Operating Area Limits and High Current Failure in ..."

Nagothu Karmel Kranthi et al. (2018)

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DOI: 10.1109/IRPS.2018.8353571

access: closed

type: Conference or Workshop Paper

metadata version: 2019-01-22

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  dblp key:
  - conf/irps/KranthiMMVS18
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  - https://dblp.org/rec/conf/irps/KranthiMMVS18
Nagothu Karmel Kranthi, Abhishek Mishra, Adil Meersha, Harsha B. Variar, Mayank Shrivastava:
Defect-Assisted Safe Operating Area Limits and High Current Failure in Graphene FETs. IRPS 2018: 3

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