BibTeX record conf/irps/MeneghiniSDBZMV15

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@inproceedings{DBLP:conf/irps/MeneghiniSDBZMV15,
  author    = {Matteo Meneghini and
               Riccardo Silvestri and
               Stefano Dalcanale and
               Davide Bisi and
               Enrico Zanoni and
               Gaudenzio Meneghesso and
               Piet Vanmeerbeek and
               Abhishek Banerjee and
               Peter Moens},
  title     = {Evidence for temperature-dependent buffer-induced trapping in GaN-on-silicon
               power transistors},
  booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
               CA, USA, April 19-23, 2015},
  pages     = {2},
  publisher = {{IEEE}},
  year      = {2015},
  url       = {https://doi.org/10.1109/IRPS.2015.7112687},
  doi       = {10.1109/IRPS.2015.7112687},
  timestamp = {Wed, 07 Oct 2020 11:09:44 +0200},
  biburl    = {https://dblp.org/rec/conf/irps/MeneghiniSDBZMV15.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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