"Degradation and Recovery Kinetics Study of Vertical and Lateral Ge-on-Si ..."

S. Musibau et al. (2024)

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DOI: 10.1109/IRPS48228.2024.10529439

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-29

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S. Musibau, N. Poumpouridis, Artemisia Tsiara, J. Franco, Mathias Berciano, Joris Van Campenhout, I. De Wout, K. Crees:
Degradation and Recovery Kinetics Study of Vertical and Lateral Ge-on-Si Photodetectors. IRPS 2024: 1-10

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