"Efficient Simulation of Electromigration Damage in Large Chip Power Grids ..."

Farid N. Najm, Valeriy Sukharev (2019)

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DOI: 10.1109/IRPS.2019.8720438

access: closed

type: Conference or Workshop Paper

metadata version: 2019-05-31

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Farid N. Najm, Valeriy Sukharev:
Efficient Simulation of Electromigration Damage in Large Chip Power Grids Using Accurate Physical Models (Invited Paper). IRPS 2019: 1-10

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