"Scaling Trends and Bias Dependence of SRAM SER from 16-nm to 3-nm FinFET."

Balaji Narasimham et al. (2024)

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DOI: 10.1109/IRPS48228.2024.10529467

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-29

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Balaji Narasimham, A-R. Montoya, C. Paone, T. Riehle, Mike Smith, Liming Tsau, Dennis R. Ball, Bharat L. Bhuva:
Scaling Trends and Bias Dependence of SRAM SER from 16-nm to 3-nm FinFET. IRPS 2024: 10

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