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"Defects affecting SiC power device reliability."

R. E. Stahbush, Nadeemullah A. Mahadik (2018)

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DOI: 10.1109/IRPS.2018.8353546

access: closed

type: Conference or Workshop Paper

metadata version: 2022-05-09

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  - conf/irps/StahbushM18
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R. E. Stahbush, Nadeemullah A. Mahadik:
Defects affecting SiC power device reliability. IRPS 2018: 2

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