"An SEU Cross Section Model Reproducing LET and Voltage Dependence in Bulk ..."

Kozo Takeuchi, Takashi Kato, Masanori Hashimoto (2024)

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DOI: 10.1109/IRPS48228.2024.10529442

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-31

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Kozo Takeuchi, Takashi Kato, Masanori Hashimoto:
An SEU Cross Section Model Reproducing LET and Voltage Dependence in Bulk Planar and FinFET SRAMs. IRPS 2024: 1-4

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