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"Full reliability characterization of three-terminal SOT-MTJ devices and ..."

Xinyi Xu et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10117643

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-24

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  dblp key:
  - conf/irps/XuZJLLLDZWCZLXJWMZLLFWL23
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  - https://dblp.org/rec/conf/irps/XuZJLLLDZWCZLXJWMZLLFWL23
Xinyi Xu, Hongchao Zhang, Chuanpeng Jiang, Jinhao Li, Shiyang Lu, Yunpeng Li, Honglei Du, Xueying Zhang, Zhaohao Wang, Kaihua Cao, Weisheng Zhao, Shuqin Lyu, Hao Xu, Bonian Jiang, Le Wang, Bowen Man, Cong Zhang, Dandan Li, Shuhui Li, Xiaofei Fan, Gefei Wang, Hong-xi Liu:
Full reliability characterization of three-terminal SOT-MTJ devices and corresponding arrays. IRPS 2023: 1-6

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