"Comprehensive defect analysis and testability of current-mode logic circuits."

Saman Adham et al. (2000)

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DOI: 10.1109/ISCAS.2000.857099

access: closed

type: Conference or Workshop Paper

metadata version: 2021-03-25

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Saman Adham, Dhamin Al-Khalili, Côme Rozon, Douglas Racz:
Comprehensive defect analysis and testability of current-mode logic circuits. ISCAS 2000: 339-342

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