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"On-chip built-in self-test of video-rate ADCs using Gaussian noise."

João Goes, Nuno Paulino, Guiomar Evans (2005)

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DOI: 10.1109/ISCAS.2005.1464708

access: closed

type: Conference or Workshop Paper

metadata version: 2019-02-04

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João Goes, Nuno Paulino, Guiomar Evans:
On-chip built-in self-test of video-rate ADCs using Gaussian noise. ISCAS (1) 2005: 796-799

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