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"Static Noise Margin and Soft-Error Rate Simulations for Thin Film ..."

Mankoo Lee, Wing-Il Sze, Chii-ming M. Wu (1995)

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DOI: 10.1109/ISCAS.1995.519919

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Mankoo Lee, Wing-Il Sze, Chii-ming M. Wu:
Static Noise Margin and Soft-Error Rate Simulations for Thin Film Transistor Cell Stability in a 4 Mbit SRAM Design. ISCAS 1995: 937-940

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